{"title":"EUV \u0026 Soft X-ray Spectrometers — UES235 Series","description":"\u003cp style=\"font-size:1rem;line-height:1.7;color:#374151;\"\u003e\nThe \u003cstrong\u003eWaveQuanta UES235\u003c\/strong\u003e series is a four-model family of flat-field grating spectrometers spanning the entire \u003cstrong\u003e1–200 nm\u003c\/strong\u003e range — VUV, EUV, and soft X-ray. Each spectrometer is built around a custom-blazed concave grating, a precision in-line entrance slit (5–300 μm, adjustable without vacuum break), and a customizable detector head (CCD \/ MCP \/ sCMOS). Designed for HHG, plasma diagnostics, and synchrotron \/ FEL beamline applications, with a laser-assisted alignment system that cuts beam-coupling time from hours to minutes.\u003c\/p\u003e","products":[{"product_id":"wq-spectrometer-ues235-s1-120","title":"UES235-S1-120 — VUV Flat-Field Grating Spectrometer (50-200nm)","description":"\u003cdiv style=\"font-family:system-ui,-apple-system,sans-serif;color:#1f2937;line-height:1.7;\"\u003e\n\u003cp style=\"font-size:0.95rem;color:#6b7280;margin:0 0 14px 0;\"\u003e\n\u003cstrong style=\"color:#1a7b9a;\"\u003eWaveQuanta\u003c\/strong\u003e · Scientific Instruments · VUV Spectrometer\n\u003c\/p\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eUES235-S1-120\u003c\/strong\u003e is a flat-field grating spectrometer optimized for the \u003cstrong\u003e50–200 nm\u003c\/strong\u003e (VUV) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed \u003cstrong\u003e120 l\/mm\u003c\/strong\u003e concave grating at \u003cstrong\u003e87°\u003c\/strong\u003e grazing incidence. The flat focal plane lets a 2D detector (CCD \/ MCP \/ sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eDemonstration — Xenon Discharge Spectrum\u003c\/h3\u003e\n\u003cp style=\"color:#374151;line-height:1.7;\"\u003eA xenon discharge plasma produces a dense forest of emission lines across the VUV\/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.\u003c\/p\u003e\n\u003cp style=\"margin:12px 0;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-ues235-xenon-discharge-spectrum.jpg?v=1780582286\" alt=\"Xenon discharge spectrum captured on UES235 focal plane\" style=\"max-width:100%;height:auto;border:1px solid #e5e7eb;border-radius:8px;display:block;margin:0 auto;\"\u003e\u003c\/p\u003e\n\u003cp style=\"font-size:0.85rem;color:#6b7280;text-align:center;margin-top:6px;font-style:italic;\"\u003eSingle-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:28px 0 12px 0;font-size:1.05rem;color:#111827;\"\u003eApplications\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;\"\u003e\n\u003cli\u003eVUV light source development and diagnostics\u003c\/li\u003e\n\u003cli\u003eHot plasma \/ discharge plasma diagnostics\u003c\/li\u003e\n\u003cli\u003eMaterial absorption \/ reflectance at VUV\u003c\/li\u003e\n\u003cli\u003eSynchrotron \/ FEL beamline characterization (VUV band)\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eConfiguration Highlights\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;font-size:0.94rem;\"\u003e\n\u003cli\u003eGrating: 120 l\/mm, 87° grazing incidence — custom Au \/ Pt \/ Ni coating per sub-band\u003c\/li\u003e\n\u003cli\u003eResolution: 0.2 nm @ 120 nm (at 13.5 μm pixel pitch, minimum slit)\u003c\/li\u003e\n\u003cli\u003eVacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)\u003c\/li\u003e\n\u003cli\u003eEntrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment\u003c\/li\u003e\n\u003cli\u003eDetector: CCD \/ MCP \/ sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible\u003c\/li\u003e\n\u003cli\u003eSpectrometer interface: KF40 standard; CF40 \/ CF63 \/ CF100 flanges optional\u003c\/li\u003e\n\u003cli\u003eDifferential pumping option for source pressures up to 1 mbar\u003c\/li\u003e\n\u003cli\u003eTTL trigger I\/O for shot-by-shot FEL \/ laser synchronization\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cdiv style=\"margin-top:28px;padding:14px 18px;background:#f9fafb;border-left:3px solid #1a7b9a;border-radius:4px;font-size:0.875rem;color:#374151;\"\u003e\n\u003cstrong\u003eThis is a quoted product.\u003c\/strong\u003e Each UES235-S1-120 is configured to the target wavelength, detector choice, and vacuum interface of the host beamline \/ experiment. Lead time is typically 12–16 weeks from PO. Use the \u003cem\u003eContact Sales\u003c\/em\u003e button to start an RFQ — please include your target wavelength, detector preference, and vacuum interface in your inquiry.\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"WaveQuanta Scientific","offers":[{"title":"Default Title","offer_id":48201732259994,"sku":"UES235-S1-120","price":0.0,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-hero-ues235-s1-120-v2_b358cdce-9130-4bff-b884-1506ccc8e226.png?v=1780582383"},{"product_id":"wq-spectrometer-ues235-s1-300","title":"UES235-S1-300 — EUV Flat-Field Grating Spectrometer (20-80nm)","description":"\u003cdiv style=\"font-family:system-ui,-apple-system,sans-serif;color:#1f2937;line-height:1.7;\"\u003e\n\u003cp style=\"font-size:0.95rem;color:#6b7280;margin:0 0 14px 0;\"\u003e\n\u003cstrong style=\"color:#1a7b9a;\"\u003eWaveQuanta\u003c\/strong\u003e · Scientific Instruments · EUV Spectrometer\n\u003c\/p\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eUES235-S1-300\u003c\/strong\u003e is a flat-field grating spectrometer optimized for the \u003cstrong\u003e20–80 nm\u003c\/strong\u003e (EUV) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed \u003cstrong\u003e300 l\/mm\u003c\/strong\u003e concave grating at \u003cstrong\u003e87°\u003c\/strong\u003e grazing incidence. The flat focal plane lets a 2D detector (CCD \/ MCP \/ sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eDemonstration — Xenon Discharge Spectrum\u003c\/h3\u003e\n\u003cp style=\"color:#374151;line-height:1.7;\"\u003eA xenon discharge plasma produces a dense forest of emission lines across the VUV\/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.\u003c\/p\u003e\n\u003cp style=\"margin:12px 0;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-ues235-xenon-discharge-spectrum.jpg?v=1780582286\" alt=\"Xenon discharge spectrum captured on UES235 focal plane\" style=\"max-width:100%;height:auto;border:1px solid #e5e7eb;border-radius:8px;display:block;margin:0 auto;\"\u003e\u003c\/p\u003e\n\u003cp style=\"font-size:0.85rem;color:#6b7280;text-align:center;margin-top:6px;font-style:italic;\"\u003eSingle-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:28px 0 12px 0;font-size:1.05rem;color:#111827;\"\u003eApplications\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;\"\u003e\n\u003cli\u003eEUV source qualification (DPP, LDP, LPP)\u003c\/li\u003e\n\u003cli\u003eHigh-harmonic generation (HHG) diagnostics\u003c\/li\u003e\n\u003cli\u003eEUV photolithography source characterization\u003c\/li\u003e\n\u003cli\u003eEUV reflectometry\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eConfiguration Highlights\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;font-size:0.94rem;\"\u003e\n\u003cli\u003eGrating: 300 l\/mm, 87° grazing incidence — custom Au \/ Pt \/ Ni coating per sub-band\u003c\/li\u003e\n\u003cli\u003eResolution: 0.15 nm @ 50 nm (at 13.5 μm pixel pitch, minimum slit)\u003c\/li\u003e\n\u003cli\u003eVacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)\u003c\/li\u003e\n\u003cli\u003eEntrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment\u003c\/li\u003e\n\u003cli\u003eDetector: CCD \/ MCP \/ sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible\u003c\/li\u003e\n\u003cli\u003eSpectrometer interface: KF40 standard; CF40 \/ CF63 \/ CF100 flanges optional\u003c\/li\u003e\n\u003cli\u003eDifferential pumping option for source pressures up to 1 mbar\u003c\/li\u003e\n\u003cli\u003eTTL trigger I\/O for shot-by-shot FEL \/ laser synchronization\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cdiv style=\"margin-top:28px;padding:14px 18px;background:#f9fafb;border-left:3px solid #1a7b9a;border-radius:4px;font-size:0.875rem;color:#374151;\"\u003e\n\u003cstrong\u003eThis is a quoted product.\u003c\/strong\u003e Each UES235-S1-300 is configured to the target wavelength, detector choice, and vacuum interface of the host beamline \/ experiment. Lead time is typically 12–16 weeks from PO. Use the \u003cem\u003eContact Sales\u003c\/em\u003e button to start an RFQ — please include your target wavelength, detector preference, and vacuum interface in your inquiry.\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"WaveQuanta Scientific","offers":[{"title":"Default Title","offer_id":48201732554906,"sku":"UES235-S1-300","price":0.0,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-hero-ues235-s1-300-v2_5563866e-1ad4-49b1-a321-a435a4f49f70.png?v=1780582385"},{"product_id":"wq-spectrometer-ues235-s1-1200","title":"UES235-S1-1200 — Soft X-ray (long) Flat-Field Grating Spectrometer (5-20nm)","description":"\u003cdiv style=\"font-family:system-ui,-apple-system,sans-serif;color:#1f2937;line-height:1.7;\"\u003e\n\u003cp style=\"font-size:0.95rem;color:#6b7280;margin:0 0 14px 0;\"\u003e\n\u003cstrong style=\"color:#1a7b9a;\"\u003eWaveQuanta\u003c\/strong\u003e · Scientific Instruments · Soft X-ray (long) Spectrometer\n\u003c\/p\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eUES235-S1-1200\u003c\/strong\u003e is a flat-field grating spectrometer optimized for the \u003cstrong\u003e5–20 nm\u003c\/strong\u003e (Soft X-ray (long)) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed \u003cstrong\u003e1200 l\/mm\u003c\/strong\u003e concave grating at \u003cstrong\u003e87°\u003c\/strong\u003e grazing incidence. The flat focal plane lets a 2D detector (CCD \/ MCP \/ sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eDemonstration — Xenon Discharge Spectrum\u003c\/h3\u003e\n\u003cp style=\"color:#374151;line-height:1.7;\"\u003eA xenon discharge plasma produces a dense forest of emission lines across the VUV\/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.\u003c\/p\u003e\n\u003cp style=\"margin:12px 0;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-ues235-xenon-discharge-spectrum.jpg?v=1780582286\" alt=\"Xenon discharge spectrum captured on UES235 focal plane\" style=\"max-width:100%;height:auto;border:1px solid #e5e7eb;border-radius:8px;display:block;margin:0 auto;\"\u003e\u003c\/p\u003e\n\u003cp style=\"font-size:0.85rem;color:#6b7280;text-align:center;margin-top:6px;font-style:italic;\"\u003eSingle-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:28px 0 12px 0;font-size:1.05rem;color:#111827;\"\u003eApplications\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;\"\u003e\n\u003cli\u003eEUV lithography 13.5 nm source diagnostics\u003c\/li\u003e\n\u003cli\u003eHHG attosecond science\u003c\/li\u003e\n\u003cli\u003eSynchrotron \/ FEL soft X-ray beamline\u003c\/li\u003e\n\u003cli\u003ePlasma emission lines in M \/ N \/ O shells\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eConfiguration Highlights\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;font-size:0.94rem;\"\u003e\n\u003cli\u003eGrating: 1200 l\/mm, 87° grazing incidence — custom Au \/ Pt \/ Ni coating per sub-band\u003c\/li\u003e\n\u003cli\u003eResolution: 0.02 nm @ 13.5 nm (at 13.5 μm pixel pitch, minimum slit)\u003c\/li\u003e\n\u003cli\u003eVacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)\u003c\/li\u003e\n\u003cli\u003eEntrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment\u003c\/li\u003e\n\u003cli\u003eDetector: CCD \/ MCP \/ sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible\u003c\/li\u003e\n\u003cli\u003eSpectrometer interface: KF40 standard; CF40 \/ CF63 \/ CF100 flanges optional\u003c\/li\u003e\n\u003cli\u003eDifferential pumping option for source pressures up to 1 mbar\u003c\/li\u003e\n\u003cli\u003eTTL trigger I\/O for shot-by-shot FEL \/ laser synchronization\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3 style=\"margin:28px 0 12px 0;font-size:1.1rem;color:#111827;\"\u003eReal Measurement Data — 13.5 nm Sn-LPP Source\u003c\/h3\u003e\n\u003cp style=\"color:#374151;line-height:1.7;\"\u003eTin laser-produced plasma source emission spectrum captured with the UES235-S1-1200 in a single shot. The full 5–20 nm range is acquired without scanning, capturing both the in-band 13.5 nm EUV lithography region and out-of-band contamination.\u003c\/p\u003e\n\u003cp style=\"margin:12px 0;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-ues235-13.5nm-counts-chart.png?v=1780582287\" alt=\"13.5 nm Sn-LPP spectrum measured with UES235-S1-1200\" style=\"max-width:100%;height:auto;border:1px solid #e5e7eb;border-radius:8px;display:block;margin:0 auto;\"\u003e\u003c\/p\u003e\n\u003cp style=\"font-size:0.85rem;color:#6b7280;text-align:center;margin-top:6px;font-style:italic;\"\u003eY-axis: photon counts (arb. unit) · X-axis: wavelength (nm) · Spectral coverage 5–20 nm captured in single shot.\u003c\/p\u003e\n\n\u003cdiv style=\"margin-top:28px;padding:14px 18px;background:#f9fafb;border-left:3px solid #1a7b9a;border-radius:4px;font-size:0.875rem;color:#374151;\"\u003e\n\u003cstrong\u003eThis is a quoted product.\u003c\/strong\u003e Each UES235-S1-1200 is configured to the target wavelength, detector choice, and vacuum interface of the host beamline \/ experiment. Lead time is typically 12–16 weeks from PO. Use the \u003cem\u003eContact Sales\u003c\/em\u003e button to start an RFQ — please include your target wavelength, detector preference, and vacuum interface in your inquiry.\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"WaveQuanta Scientific","offers":[{"title":"Default Title","offer_id":48201732587674,"sku":"UES235-S1-1200","price":0.0,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-hero-ues235-s1-1200-v2_c734d8f9-8078-4d63-a4b8-14e35d9b93ba.png?v=1780582388"},{"product_id":"wq-spectrometer-ues235-s1-2400","title":"UES235-S1-2400 — Soft X-ray (short) Flat-Field Grating Spectrometer (1-6nm)","description":"\u003cdiv style=\"font-family:system-ui,-apple-system,sans-serif;color:#1f2937;line-height:1.7;\"\u003e\n\u003cp style=\"font-size:0.95rem;color:#6b7280;margin:0 0 14px 0;\"\u003e\n\u003cstrong style=\"color:#1a7b9a;\"\u003eWaveQuanta\u003c\/strong\u003e · Scientific Instruments · Soft X-ray (short) Spectrometer\n\u003c\/p\u003e\n\n\u003cp\u003eThe \u003cstrong\u003eUES235-S1-2400\u003c\/strong\u003e is a flat-field grating spectrometer optimized for the \u003cstrong\u003e1–6 nm\u003c\/strong\u003e (Soft X-ray (short)) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed \u003cstrong\u003e2400 l\/mm\u003c\/strong\u003e concave grating at \u003cstrong\u003e88.65°\u003c\/strong\u003e grazing incidence. The flat focal plane lets a 2D detector (CCD \/ MCP \/ sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eDemonstration — Xenon Discharge Spectrum\u003c\/h3\u003e\n\u003cp style=\"color:#374151;line-height:1.7;\"\u003eA xenon discharge plasma produces a dense forest of emission lines across the VUV\/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.\u003c\/p\u003e\n\u003cp style=\"margin:12px 0;\"\u003e\u003cimg src=\"https:\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-ues235-xenon-discharge-spectrum.jpg?v=1780582286\" alt=\"Xenon discharge spectrum captured on UES235 focal plane\" style=\"max-width:100%;height:auto;border:1px solid #e5e7eb;border-radius:8px;display:block;margin:0 auto;\"\u003e\u003c\/p\u003e\n\u003cp style=\"font-size:0.85rem;color:#6b7280;text-align:center;margin-top:6px;font-style:italic;\"\u003eSingle-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.\u003c\/p\u003e\n\n\u003ch3 style=\"margin:28px 0 12px 0;font-size:1.05rem;color:#111827;\"\u003eApplications\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;\"\u003e\n\u003cli\u003eWater-window soft X-ray imaging\u003c\/li\u003e\n\u003cli\u003eHigh-Z plasma K-shell emission\u003c\/li\u003e\n\u003cli\u003eHHG harmonics into water window\u003c\/li\u003e\n\u003cli\u003eSoft X-ray contact microscopy\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003ch3 style=\"margin:24px 0 10px 0;font-size:1.05rem;color:#111827;\"\u003eConfiguration Highlights\u003c\/h3\u003e\n\u003cul style=\"line-height:1.7;color:#374151;font-size:0.94rem;\"\u003e\n\u003cli\u003eGrating: 2400 l\/mm, 88.65° grazing incidence — custom Au \/ Pt \/ Ni coating per sub-band\u003c\/li\u003e\n\u003cli\u003eResolution: 0.01 nm @ 5 nm (at 13.5 μm pixel pitch, minimum slit)\u003c\/li\u003e\n\u003cli\u003eVacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)\u003c\/li\u003e\n\u003cli\u003eEntrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment\u003c\/li\u003e\n\u003cli\u003eDetector: CCD \/ MCP \/ sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible\u003c\/li\u003e\n\u003cli\u003eSpectrometer interface: KF40 standard; CF40 \/ CF63 \/ CF100 flanges optional\u003c\/li\u003e\n\u003cli\u003eDifferential pumping option for source pressures up to 1 mbar\u003c\/li\u003e\n\u003cli\u003eTTL trigger I\/O for shot-by-shot FEL \/ laser synchronization\u003c\/li\u003e\n\u003c\/ul\u003e\n\n\u003cdiv style=\"margin-top:28px;padding:14px 18px;background:#f9fafb;border-left:3px solid #1a7b9a;border-radius:4px;font-size:0.875rem;color:#374151;\"\u003e\n\u003cstrong\u003eThis is a quoted product.\u003c\/strong\u003e Each UES235-S1-2400 is configured to the target wavelength, detector choice, and vacuum interface of the host beamline \/ experiment. Lead time is typically 12–16 weeks from PO. Use the \u003cem\u003eContact Sales\u003c\/em\u003e button to start an RFQ — please include your target wavelength, detector preference, and vacuum interface in your inquiry.\n\u003c\/div\u003e\n\u003c\/div\u003e","brand":"WaveQuanta Scientific","offers":[{"title":"Default Title","offer_id":48201732620442,"sku":"UES235-S1-2400","price":0.0,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-hero-ues235-s1-2400-v2_208b3b0c-c6af-4692-8a90-058fffcf0c20.png?v=1780582391"}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/collections\/wq-hero-ues235-s1-1200.png?v=1780582393","url":"https:\/\/waveqvanta.com\/collections\/wq-euv-spectrometers.oembed","provider":"WaveQuanta","version":"1.0","type":"link"}