{"product_id":"dsr500-lbic-micro-nano-photoelectric-imaging-system","title":"DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot","description":"\u003cdiv class=\"wq-pdp__lbtek-desc\"\u003e\n\u003cp\u003e\u003cem\u003eGalvo-scanned laser photocurrent imaging for mapping short-circuit current, defects and reflectance in micro-nano devices.\u003c\/em\u003e\u003c\/p\u003e\n\u003cp\u003eThe DSR500-LBIC combines microscopic imaging with galvanometer laser scanning to deliver a small, stable monochromatic spot onto photovoltaic and photoelectric test devices. As the spot is scanned in XY, the software records the current at each point and builds a map of short-circuit current distribution, surface defects and reflectance, with the spot profile kept constant across the scan field. Typical samples include dye-sensitized, mono- and multicrystalline silicon, organic semiconductor and GaN devices.\u003c\/p\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wq-pdp__lbtek-tips\"\u003e\n\u003ch3\u003eKey Features\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eGalvo scanning for fast, high-resolution mapping without stage vibration effects\u003c\/li\u003e\n\u003cli\u003eStandard 532 nm laser; a second laser (405 or 635 nm, 10 or 30 mW) optional\u003c\/li\u003e\n\u003cli\u003e20× objective with 260 × 200 µm maximum scan field, 2 µm laser spot and 0.2 µm minimum step\u003c\/li\u003e\n\u003cli\u003eKeithley 2450 source meter: 1 nA–1 A current range, 20 fA resolution, 0.03% accuracy\u003c\/li\u003e\n\u003cli\u003e65 mm vacuum chuck carries both sample and probe holders, so moving the sample keeps electrode contact\u003c\/li\u003e\n\u003cli\u003ePhotocurrent mapping at fixed bias and point-by-point I-V curve scanning over a user-selected area\u003c\/li\u003e\n\u003cli\u003eOptional spectral responsivity, QE and bias voltage tests from 200 to 1100 nm, extendable to 2500 nm\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wq-pdp__lbtek-tips\"\u003e\n\u003ch3\u003eTypical Applications\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003eNanomaterials and 2D materials\u003c\/li\u003e\n\u003cli\u003eWafer analysis\u003c\/li\u003e\n\u003cli\u003ePhotoelectric characterization of detectors\u003c\/li\u003e\n\u003cli\u003ePixel measurement of area-array detectors\u003c\/li\u003e\n\u003cli\u003eMicro-domain charge generation in devices\u003c\/li\u003e\n\u003cli\u003eSolar cell current uniformity and defect analysis\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wq-pdp__lbtek-tips\"\u003e\n\u003ch3\u003eModel Overview\u003c\/h3\u003e\n\u003cdiv style=\"overflow-x:auto\"\u003e\u003ctable style=\"border-collapse:collapse;width:100%;font-size:13px\"\u003e\n\u003cthead\u003e\u003ctr\u003e\n\u003cth style=\"border:1px solid #d0d7e2;padding:4px 6px;background:#f2f5f9;text-align:left\"\u003eModel\u003c\/th\u003e\n\u003cth style=\"border:1px solid #d0d7e2;padding:4px 6px;background:#f2f5f9;text-align:left\"\u003eLaser\u003c\/th\u003e\n\u003cth style=\"border:1px solid #d0d7e2;padding:4px 6px;background:#f2f5f9;text-align:left\"\u003eObjective\u003c\/th\u003e\n\u003cth style=\"border:1px solid #d0d7e2;padding:4px 6px;background:#f2f5f9;text-align:left\"\u003eProbe Station\u003c\/th\u003e\n\u003cth style=\"border:1px solid #d0d7e2;padding:4px 6px;background:#f2f5f9;text-align:left\"\u003eData Acquisition Unit\u003c\/th\u003e\n\u003c\/tr\u003e\u003c\/thead\u003e\n\u003ctbody\u003e\n\u003ctr\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003eDSR500-LBIC\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e532 nm, 30 mW\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e20×, WD 7.5 mm\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e2 probe holders\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003eKeithley 2450\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003eDSR500-LBIC-RDB\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e532 nm, 30 mW\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e20×, WD 7.5 mm\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003e2 probe holders\u003c\/td\u003e\n\u003ctd style=\"border:1px solid #d0d7e2;padding:4px 6px\"\u003eNot included\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/tbody\u003e\n\u003c\/table\u003e\u003c\/div\u003e\n\u003c\/div\u003e\n\u003cdiv class=\"wq-pdp__lbtek-tips\"\u003e\n\u003ch3\u003eRelated Products\u003c\/h3\u003e\n\u003cul\u003e\n\u003cli\u003e\n\u003ca href=\"\/products\/solariv-series-solar-cell-i-v-test-system\"\u003eSolarIV Series\u003c\/a\u003e — Solar Cell I-V Test System\u003c\/li\u003e\n\u003cli\u003e\n\u003ca href=\"\/products\/sirius-series-solar-simulators\"\u003eSirius Series\u003c\/a\u003e — Solar Simulators\u003c\/li\u003e\n\u003cli\u003e\n\u003ca href=\"\/products\/scs600-max-large-area-solar-cell-qe-system\"\u003eSCS600-MAX\u003c\/a\u003e — Large-Area Solar Cell QE System\u003c\/li\u003e\n\u003c\/ul\u003e\n\u003cp\u003eBrowse all: \u003ca href=\"\/collections\/lbtek-light-analysis-photoelectric-test-systems\"\u003ePhotoelectric Test Systems\u003c\/a\u003e · \u003ca href=\"\/collections\/lbtek-light-analysis-spectroscopic-instruments\"\u003eSpectroscopic Instruments\u003c\/a\u003e\u003c\/p\u003e\n\u003c\/div\u003e\n\u003cp\u003e\u003cstrong\u003eModels: DSR500-LBIC, DSR500-LBIC-RDB\u003c\/strong\u003e · Contact WaveQuanta for a quote, configuration advice and lead time.\u003c\/p\u003e","brand":"WaveQuanta","offers":[{"title":"Default Title","offer_id":68106327326874,"sku":"DSR500-LBIC","price":0.0,"currency_code":"SGD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0734\/6156\/3546\/files\/wq-dsr500-lbic-micro-nano-photoelectric-imaging-system-1.jpg?v=1794127821","url":"https:\/\/waveqvanta.com\/products\/dsr500-lbic-micro-nano-photoelectric-imaging-system","provider":"WaveQuanta","version":"1.0","type":"link"}