UES235-S1-120 — VUV Flat-Field Grating Spectrometer (50-200nm)

WaveQuanta · Scientific Instruments · VUV Spectrometer

The UES235-S1-120 is a flat-field grating spectrometer optimized for the 50–200 nm (VUV) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed 120 l/mm concave grating at 87° grazing incidence. The flat focal plane lets a 2D detector (CCD / MCP / sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.

Demonstration — Xenon Discharge Spectrum

A xenon discharge plasma produces a dense forest of emission lines across the VUV/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.

Single-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.

Applications

• VUV light source development and diagnostics
• Hot plasma / discharge plasma diagnostics
• Material absorption / reflectance at VUV
• Synchrotron / FEL beamline characterization (VUV band)

Configuration Highlights

• Grating: 120 l/mm, 87° grazing incidence — custom Au / Pt / Ni coating per sub-band
• Resolution: 0.2 nm @ 120 nm (at 13.5 μm pixel pitch, minimum slit)
• Vacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)
• Entrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment
• Detector: CCD / MCP / sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible
• Spectrometer interface: KF40 standard; CF40 / CF63 / CF100 flanges optional
• Differential pumping option for source pressures up to 1 mbar
• TTL trigger I/O for shot-by-shot FEL / laser synchronization