UES235-S1-2400 — Soft X-ray (short) Flat-Field Grating Spectrometer (1-6nm)

WaveQuanta · Scientific Instruments · Soft X-ray (short) Spectrometer

The UES235-S1-2400 is a flat-field grating spectrometer optimized for the 1–6 nm (Soft X-ray (short)) wavelength range. EUV and soft X-ray photons enter through an in-line adjustable slit (5–300 μm, no vacuum break required) and reach a custom-blazed 2400 l/mm concave grating at 88.65° grazing incidence. The flat focal plane lets a 2D detector (CCD / MCP / sCMOS) capture the full wavelength range in a single shot — ideal for transient sources like HHG, laser-produced plasma, and FEL pulses.

Demonstration — Xenon Discharge Spectrum

A xenon discharge plasma produces a dense forest of emission lines across the VUV/EUV bands. The image below is a single CCD focal-plane capture: vertical streaks correspond to individual Xe lines, dispersed by wavelength along the horizontal axis.

Single-shot 2D image · vertical streaks are individual Xe emission lines dispersed across the focal plane.

Applications

• Water-window soft X-ray imaging
• High-Z plasma K-shell emission
• HHG harmonics into water window
• Soft X-ray contact microscopy

Configuration Highlights

• Grating: 2400 l/mm, 88.65° grazing incidence — custom Au / Pt / Ni coating per sub-band
• Resolution: 0.01 nm @ 5 nm (at 13.5 μm pixel pitch, minimum slit)
• Vacuum: 1 × 10⁻⁴ Pa baseline (UHV options to 10⁻⁹ Pa available)
• Entrance slit: 5–300 μm in-line adjustable, with built-in laser-assisted alignment
• Detector: CCD / MCP / sCMOS — Andor (DO920P-BEN, Newton 940), Princeton Instruments, Hamamatsu compatible
• Spectrometer interface: KF40 standard; CF40 / CF63 / CF100 flanges optional
• Differential pumping option for source pressures up to 1 mbar
• TTL trigger I/O for shot-by-shot FEL / laser synchronization