Scanning lens, widely used in laser scanning microscopy systems. LBSL5-50-20-2P2

LBTEK scanning lenses are designed with a telecentric optical path and f-theta aberration correction, converting the angular deflection of the galvanometer into linear displacement on the focal plane, achieving geometric distortion suppression and flat image plane output. This series of products is primarily designed for laser scanning microscopy systems and can be paired with tube lenses and objectives to realize a telecentric imaging optical path. The working wavelength range covers visible to near-infrared, with options of 400-750 nm, 450-1100 nm, 680-1300 nm, and 800-1800 nm, which can be selected based on the specific application.