
CEP-Tag — Carrier-Envelope Phase Measurement & Tagging (100 kHz+)
Design Tools
Measure and tag the carrier-envelope phase of your laser system on the fly.
Understanding the carrier-envelope phase (CEP) offset is crucial in strong-field laser-matter interactions. Our CEP-tag system measures CEP offset of amplified laser pulses at single-shot, up to hundreds of kHz.
Using the proven technique of f-2f interferometry, the system broadens the input pulse spectrum over an octave and interferes the spectral wings to extract CEP. Our solutions feature digital or all-optical analog fast-Fourier-transform extraction for high-fidelity, low-noise output.
Key features
- Single-shot CEP measurement and tagging
- Digital models — acquisition at up to 400 kHz
- Analog models — high-throughput f-2f interferometry (*to be released)
- Compatible with 800 nm and 1030 nm wavelengths
| Models | CEP-tag D |
|---|---|
| Central wavelength | 800 nm or 1030 nm |
| Repetition Rate | 170, 200, 300 or 400 kHz |
| Input Polarisation | Linear |
| Input aperture diameter | 10 mm |
| Input energy | 100 nJ |
| Dimensions (WxLxH) | 200 × 200 × 55 mm |
Source: Sphere Ultrafast Photonics manufacturer datasheet. Download the brochure (PDF) from the Documents tab for full details.
Product Family: Pulse Diagnostics (D-scan) (6 variants)
| Product | SKU | Size | Clear Aperture | Operating Wavelength | |
|---|---|---|---|---|---|
| ICE — Spatio-Temporal Characterization of Ultrafast Pulses |
| — | — | — | Contact |
| CEP-Tag — Carrier-Envelope Phase Measurement & Tagging (100 kHz+) Current |
| — | — | — | |
| D-Vision — Single-Sensor VIS-SWIR Spectrometer (500-1700 nm) |
| — | — | — | Contact |
| B-Shot — Single-Shot Ultrafast Pulse Temporal Measurement |
| — | — | — | Contact |
| D-Max — High-Performance Ultrafast Pulse Temporal Measurement |
| — | — | — | Contact |
| D-Scan — Inline Ultrafast Pulse Measurement & Compression |
| — | — | — | Contact |