Sphere Ultrafast Photonics

CEP-Tag — Carrier-Envelope Phase Measurement & Tagging (100 kHz+)

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Measure and tag the carrier-envelope phase of your laser system on the fly.

Understanding the carrier-envelope phase (CEP) offset is crucial in strong-field laser-matter interactions. Our CEP-tag system measures CEP offset of amplified laser pulses at single-shot, up to hundreds of kHz.

Using the proven technique of f-2f interferometry, the system broadens the input pulse spectrum over an octave and interferes the spectral wings to extract CEP. Our solutions feature digital or all-optical analog fast-Fourier-transform extraction for high-fidelity, low-noise output.

Key features

  • Single-shot CEP measurement and tagging
  • Digital models — acquisition at up to 400 kHz
  • Analog models — high-throughput f-2f interferometry (*to be released)
  • Compatible with 800 nm and 1030 nm wavelengths
ModelsCEP-tag D
Central wavelength800 nm or 1030 nm
Repetition Rate170, 200, 300 or 400 kHz
Input PolarisationLinear
Input aperture diameter10 mm
Input energy100 nJ
Dimensions (WxLxH)200 × 200 × 55 mm
* Analog models to be released — talk to us for different wavelengths and model options.

Source: Sphere Ultrafast Photonics manufacturer datasheet. Download the brochure (PDF) from the Documents tab for full details.

No CAD drawings available for this product.