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DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping
DSR300 SeriesContact for pricing
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Spectral response and photocurrent mapping of micro- and nano-scale devices and low-dimensional materials.
The DSR300 series is designed for low-dimensional materials and micro-nano devices, combining spectral scanning with photocurrent scanning under a microscope. A 40 µm probe spot allows samples as small as 100 µm to be measured, and xenon, supercontinuum, CW laser and picosecond pulsed laser sources can be integrated to test different detector types. The instruments are operated automatically from the control software.
Key Features
- Spectral responsivity, external quantum efficiency, bias-voltage I-t curves, LBIC mapping and response linearity tests
- 40 µm spot at 550 nm (50× objective, 200 µm fiber); 5 µm spot with a 375 nm picosecond laser and 40× objective
- Four light paths: three built-in plus one external path for tunable broadband monochromatic light
- Light source options: xenon (250–1800 nm), supercontinuum (400–2400 nm), CW lasers and picosecond pulsed lasers
- Lock-in amplifier or Keithley 2612B / 2636B source meters, with current resolution down to 10 fA
- Probe station with four XYZ probe holders, 2 m triaxial cables (< 1 pA leakage) and vacuum sample stage
- Cryostat from −196 to 600 °C and LBIC mapping stage with 1 µm scanning spatial resolution
Typical Applications
- 2D and low-dimensional material photodetectors
- Micro-nano optoelectronic device characterization
- Photocurrent (LBIC) mapping
- Response time (rise and fall) and linearity tests
- Temperature-dependent photoresponse studies
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Browse all: Photoelectric Test Systems · Spectroscopic Instruments
Model: DSR300 Series · Contact WaveQuanta for a quote, configuration advice and lead time.
| Detection Spot | 40 µm (550 nm, 50× objective, 200 µm fiber) |
| Other Spot Sizes | 70 µm (400 µm fiber); 5 µm (375 nm ps laser, 40×); 80 µm (40× reflective objective) |
| Minimum Sample Size | 100 µm |
| Light Paths | 4 (3 built-in, 1 external for tunable broadband monochromatic light) |
| Xenon Light Source | 250–1800 nm, instability < 1% |
| Supercontinuum Source | 400–2400 nm, 0.01–200 MHz, 100 ps pulse width |
| CW Laser Options | 405, 532, 633, 808 or 980 nm; instability < 1% |
| Pulsed Laser Options | 375, 405, 488, 785 or 976 nm; 100 ps pulse width; 1–20 MHz |
| Objective 10× (Standard) | WD > 17 mm, NA 0.42, 350–800 nm |
| Objective 50× | WD > 17 mm, NA 0.42, 480–1800 nm |
| Objective 50× UV | WD > 12 mm, NA 0.42, 240–500 nm |
| Objective 40× Reflective | WD > 7.8 mm, NA 0.5, 200 nm–20 µm |
| Lock-in Amplifier | 20 Hz–1 kHz, 1 nV–1 V full-scale sensitivity, dynamic reserve > 100 dB |
| Lock-in Details | Voltage or current input, current gain 10⁶ or 10⁸ V/A, drift < 0.1°/°C, X/Y/R/θ display |
| Keithley 2612B | Current range 100 nA / 1 A, min. signal 1 nA, noise 100 pA, resolution 100 fA, 2 channels |
| Keithley 2636B | Current range 1 nA / 1 A, min. signal 10 pA, noise 1 pA, resolution 10 fA, 2 channels |
| Cryostat Temperature | −196 to 600 °C, resolution 0.1 °C |
| Cryostat Optics | Clear aperture 24 mm, sample area Φ22 mm, working distance 4.5–12.5 mm |
| Cryostat Chamber | Air-tight, can be filled with protective gas, independent temperature control |
| Probe Holders | 4, with 20 or 10 µm tips; XYZ adjustable, 12 mm travel, 0.75 µm resolution |
| Cabling | 2 m triaxial cable, leakage current < 1 pA |
| Sample Stage | Vacuum adsorption |
| LBIC Mapping Stage | XY travel 50 mm, resolution 5 µm, scanning spatial resolution 1 µm |
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Product Family: Photoelectric Test Systems (9 variants)
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|---|---|---|---|---|---|
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| DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping Current |
DSR300 Series
| — | — | — | |
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