

DSR900 Camera Characteristics Measurement System, EMVA 1288, 200–2500 nm
DSR900Design Tools
Automated system for evaluating CCD and CMOS cameras and image sensors according to EMVA 1288.
The DSR900 is a multifunctional test system for characterizing CCD and CMOS cameras and imaging sensors in the visible and infrared, following the EMVA 1288 standard. A tunable monochromatic source with integrating sphere, a large uniform broadband source and a light-tight dark chamber with motorized stage are run from software that performs the test sequence with one click and outputs standardized test reports.
Key Features
- Full camera parameter testing to EMVA 1288 for visible and infrared cameras
- One-click automated test sequence with standardized report output
- Tunable source: 150 W xenon lamp, 320 mm F/4.2 spectrograph and 200 mm integrating sphere, 200–2500 nm
- Uniform broadband source: 1100 mm integrating sphere with 100 mm output port and 2 to 6 halogen lamps
- Light-tight dark chamber, 2000 × 1500 × 1450 mm, > 80 dB stray light suppression, 3D motorized stage
- Measures QE, dynamic range, read noise, gain, SNR, dark current, MTF, full well, linearity and defective pixels
Typical Applications
- CCD and CMOS camera performance evaluation
- Image sensor quantum efficiency measurement
- Visible and infrared camera testing
- Camera manufacturer quality evaluation
- Machine vision camera characterization to EMVA 1288
Related Products
- SolarIV Series — Solar Cell I-V Test System
- Sirius Series — Solar Simulators
- SCS600-MAX — Large-Area Solar Cell QE System
Browse all: Photoelectric Test Systems · Spectroscopic Instruments
Model: DSR900 · Contact WaveQuanta for a quote, configuration advice and lead time.
| Standard | EMVA 1288 |
| Test Parameters | QE, dynamic range, read noise, gain, SNR, responsivity, detection rate, dark current |
| Further Test Parameters | Linearity, MTF, full well, absolute sensitivity, dark/response non-uniformity, bad pixels |
| Xenon Arc Lamp | 150 W, 200–2500 nm, instability < 0.5%, 7.5 A, 3000 h lifetime |
| Spectrograph | 320 mm focal length, F/4.2, 0.08 nm resolution (1200 g/mm), 200–2500 nm |
| Bandwidth | Adjustable 0.5–12 nm |
| Stray Light | 1 × 10⁻⁵ |
| Integrating Sphere (Tunable Source) | Φ200 mm, PTFE (F4), coating reflectivity > 95%, 250–2500 nm |
| Broadband Integrating Sphere | Φ1100 mm, 100 mm output port |
| Broadband Lamps | 2 to 6 halogen lamps, 50 W, DC 12 V |
| Broadband Spectral Range | 340–2500 nm |
| Dark Chamber Size | 2000 × 1500 × 1450 mm |
| Stray Light Suppression | > 80 dB @ 300–1700 nm |
| Stage Travel | 100 mm along optical axis, 100 mm vertical |
| Software Tests | Noise, response and detection rate, dynamic range and linearity, NUC, bad pixel location |
| Software Image Tools | Test area selection, image storage, rotation, magnification, autorange, result saving |
Product Family: Photoelectric Test Systems (9 variants)
| Product | SKU | Size | Clear Aperture | Operating Wavelength | |
|---|---|---|---|---|---|
| DSR900 Camera Characteristics Measurement System, EMVA 1288, 200–2500 nm Current |
DSR900
| — | — | — | |
| DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot |
DSR500-LBIC
| — | — | — | Contact |
| DSR600 Photodetector Spectral Response System, 200–2400 nm, Lock-in Detection |
DSR600 Series
| — | — | — | Contact |
| DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping |
DSR300 Series
| — | — | — | Contact |
| QE-B1 Calibrated Silicon Reference Cell, 20 × 20 mm, NIST-Traceable |
QE-B1
| — | — | — | Contact |
| SCS600 Series Solar Cell Quantum Efficiency System, EQE/IQE, 300–2500 nm |
SCS600 Series
| — | — | — | Contact |
| SCS600-MAX Large-Area Solar Cell QE System, 250 × 250 mm, QE and LBIC Mapping |
SCS600-MAX
| — | — | — | Contact |
| SolarIV Series Solar Cell I-V Test System, Class A AM1.5G Simulator |
SolarIV Series
| — | — | — | Contact |
| Sirius Series Solar Simulators, Class A AM1.5G, 0.2–1.2 Sun Adjustable |
Sirius Series
| — | — | — | Contact |






