
QE-B1 Calibrated Silicon Reference Cell, 20 × 20 mm, NIST-Traceable
QE-B1Design Tools
Calibrated silicon reference cell for setting solar simulator irradiance and referencing solar cell conversion efficiency.
The QE-B1 is a 20 × 20 mm monocrystalline silicon solar cell supplied with calibration data traceable to NIST. In solar cell testing, and in I-V measurement in particular, it is used to set the illumination intensity of the light source and to reference the conversion efficiency of the cell under test. Different window materials are available as options.
Key Features
- 20 × 20 mm monocrystalline silicon solar cell
- Calibration data traceable to NIST
- Sets the irradiance of the light source before I-V measurement
- Optional window materials
- Used with I-V measurement software for Keithley 24XX series source meters (Isc, Voc, FF, efficiency, Rs, Rsh)
- Software supports forward/reverse scans with speed control, dark-current subtraction, cycle scans and dual-voltage I-t scans
Typical Applications
- Irradiance calibration of solar simulators
- Solar cell I-V measurement
- Conversion efficiency comparison of solar cells
- Reference device in photovoltaic test systems
Related Products
- SolarIV Series — Solar Cell I-V Test System
- Sirius Series — Solar Simulators
- SCS600-MAX — Large-Area Solar Cell QE System
Browse all: Photoelectric Test Systems · Spectroscopic Instruments
Model: QE-B1 · Contact WaveQuanta for a quote, configuration advice and lead time.
| Cell Type | Monocrystalline silicon solar cell |
| Cell Size | 20 × 20 mm |
| Calibration | Traceable to NIST |
| Window | Different window materials optional |
| Typical Use | Light source irradiance calibration for I-V measurement |
| Companion Software | I-V measurement software for Keithley 24XX series source meters |
| Software Parameters | Isc, Jsc, Voc, Pmax, Imp, Vmp, FF, efficiency, Rs, Rsh |
| Software Scan Modes | Forward/reverse with speed control, dark-current subtraction, cycle scan, dual-voltage I-t |
Product Family: Photoelectric Test Systems (9 variants)
| Product | SKU | Size | Clear Aperture | Operating Wavelength | |
|---|---|---|---|---|---|
| DSR900 Camera Characteristics Measurement System, EMVA 1288, 200–2500 nm |
DSR900
| — | — | — | Contact |
| DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot |
DSR500-LBIC
| — | — | — | Contact |
| DSR600 Photodetector Spectral Response System, 200–2400 nm, Lock-in Detection |
DSR600 Series
| — | — | — | Contact |
| DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping |
DSR300 Series
| — | — | — | Contact |
| QE-B1 Calibrated Silicon Reference Cell, 20 × 20 mm, NIST-Traceable Current |
QE-B1
| — | — | — | |
| SCS600 Series Solar Cell Quantum Efficiency System, EQE/IQE, 300–2500 nm |
SCS600 Series
| — | — | — | Contact |
| SCS600-MAX Large-Area Solar Cell QE System, 250 × 250 mm, QE and LBIC Mapping |
SCS600-MAX
| — | — | — | Contact |
| SolarIV Series Solar Cell I-V Test System, Class A AM1.5G Simulator |
SolarIV Series
| — | — | — | Contact |
| Sirius Series Solar Simulators, Class A AM1.5G, 0.2–1.2 Sun Adjustable |
Sirius Series
| — | — | — | Contact |






