DSR600 Series photodetector spectral response measurement system
WaveQuanta

DSR600 Photodetector Spectral Response System, 200–2400 nm, Lock-in Detection

DSR600 Series
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Turnkey platform for measuring spectral responsivity, quantum efficiency and reflectance of photodetectors and optoelectronic materials.

The DSR600 is a turnkey, multifunctional platform built around spectral response measurement that automatically performs spectral response, quantum efficiency, reflectance and mapping tests on optoelectronic devices and materials. It uses the substitution method, the standard approach of metrology institutes for spectral responsivity, so only the standard detector needs periodic calibration and no alignment is needed before measurements. Optional spectral coverage within 200–2400 nm suits deep-UV solar-blind detectors, solar cells and near-infrared sensors.

Key Features

  • Spectral response, bias-voltage spectral response, EQE/IQE, reflectance, transmittance, short-circuit current density and I-V measurement
  • Substitution-method design: only the standard detector requires regular calibration, no alignment before tests
  • All-reflective optical path keeps spot size and position constant as the wavelength changes
  • Light source options: EQ source (190–2100 nm), xenon (250–2000 nm), dual source (250–2500 nm) and blackbody (300–1500 °C)
  • Lock-in detection with DCS540 optical chopper (20 Hz–5 kHz) and DCS500PA digital lock-in amplifier (50 mHz–120 kHz)
  • Sample chamber with monitoring CCD, probe stage, triaxial-cable probes and optional vacuum adsorption stage
  • Software stores test plans and sample information, runs bias-voltage tests automatically and exports TXT or Excel files

Typical Applications

  • Deep-UV solar-blind detector characterization
  • Solar cell spectral response and EQE
  • Near-infrared fiber sensor testing
  • Photovoltaic and photoconductive detector research
  • Reflectance and transmittance of optoelectronic materials

Model Overview

Model Light Source Spectral Range Repeatability 200–400 nm Repeatability 400–1000 nm Repeatability 1000–1700 nm Data Acquisition Spot
DSR600-3111 Xenon 300–1700 nm ≥98% ≥99% ≥98% Lock-in ≤1 mm
DSR600-3121 Tungsten 400–2400 nm – ≥99% ≥98% Lock-in ≤1 mm

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Models: DSR600-3111, DSR600-3121 · Contact WaveQuanta for a quote, configuration advice and lead time.

Measurement Functions Spectral response, bias SR, EQE, IQE, reflectance, transmittance, Jsc, I-V
Spectral Range 200–2400 nm (optional, depends on configuration)
Measurement Method Substitution method with standard detector
Detector Types Photovoltaic (solar cells, FETs, PSDs, array devices) and photoconductive detectors
Probe Spot ≤ 1 mm
Data Acquisition Lock-in
Optical Path All-reflective, no chromatic aberration
EQ Light Source 190–2100 nm, 100 µm luminous point, 9000 h lifetime, high UV output
Xenon Light Source 250–2000 nm, 1 mm luminous point
Dual Light Source 250–2500 nm, UV to NIR
Blackbody Source 300–1500 °C, 38 or 58 mm aperture, stability 0.3 K, resolution 0.1 K
Optical Chopper DCS540 20 Hz–5 kHz, 0.01 Hz resolution, 2.4-inch LCD, TTL/CMOS input and output
Lock-in Amplifier DCS500PA 50 mHz–120 kHz, 1 nV–1 V full-scale sensitivity, up to 100 dB dynamic reserve
Lock-in Inputs Low-noise current and voltage inputs
Source Meter 5½-digit, 200 mV–20 V ranges, > 2000 readings/s, GPIB/RS-232, 20 W
Sample Chamber Monitoring CCD, probe stage, triaxial-cable probes, optional vacuum adsorption stage
Data Export TXT, Excel
Specification Sheet PDF — Download
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