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SCS600-MAX Large-Area Solar Cell QE System, 250 × 250 mm, QE and LBIC Mapping
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Quantum efficiency, reflectance and LBIC mapping of large-format solar cells up to 250 × 250 mm.
The SCS600-MAX measures spectral response and quantum efficiency of large solar cells up to 250 × 250 mm. A xenon and tungsten dual-source configuration compliant with IEC 60904 covers the solar spectrum with high intensity stability for repeatable results, and fast QE, reflectance and LBIC mapping reveals defect distribution and minority carrier diffusion length across the cell.
Key Features
- Spectral responsivity, EQE, IQE, IPCE, reflectance, transmittance, integrated Jsc and beam-induced current
- QE, reflectivity and LBIC mapping of cells up to 250 × 250 mm
- Optional dual xenon/tungsten source switching to IEC 60904, intensity instability < 0.8% over 1000 s
- Spectral range 300–1100 nm, extendable to 1700 nm
- AC and DC data acquisition modes
- Mapping at different wavelengths (e.g. 400, 650, 950 nm) probes different depths of silicon cells
- Parameter sets saved as configuration files per sample; data export as TXT, Excel or images
Typical Applications
- Large-area silicon solar cell QE testing
- Defect and uniformity inspection by QE/LBIC mapping
- Minority carrier diffusion length analysis
- Reflectance uniformity checks of cell surfaces
- Depth-resolved inspection of silicon cells
Related Products
- SolarIV Series — Solar Cell I-V Test System
- Sirius Series — Solar Simulators
- SCS600 Series — Solar Cell Quantum Efficiency System
Browse all: Photoelectric Test Systems · Spectroscopic Instruments
Model: SCS600-MAX · Contact WaveQuanta for a quote, configuration advice and lead time.
| Suitable Samples | Large-size solar cells |
| Maximum Sample Size | 250 × 250 mm |
| Maximum Scan Area | 250 × 150 mm |
| Spectral Range | 300–1100 nm, 1700 nm optional |
| Light Source | 150 W xenon lamp; dual xenon/tungsten source switching optional |
| Intensity Instability | < 0.8% over 1000 s (dual source) |
| Light Spot Diameter | 2–15 mm |
| Step | 5 nm |
| Position Accuracy | 10 µm |
| Data Collection Mode | AC and DC |
| Measurement Functions | SR, EQE, IQE, IPCE, reflectance, transmittance, integrated Jsc, LBIC |
| Mapping Functions | QE mapping, reflectivity mapping, LBIC mapping |
| Standard | IEC 60904 |
| Data Export | TXT, Excel, images |
No CAD drawings available for this product.
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Product Family: Photoelectric Test Systems (9 variants)
| Product | SKU | Size | Clear Aperture | Operating Wavelength | |
|---|---|---|---|---|---|
| DSR900 Camera Characteristics Measurement System, EMVA 1288, 200–2500 nm |
DSR900
| — | — | — | Contact |
| DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot |
DSR500-LBIC
| — | — | — | Contact |
| DSR600 Photodetector Spectral Response System, 200–2400 nm, Lock-in Detection |
DSR600 Series
| — | — | — | Contact |
| DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping |
DSR300 Series
| — | — | — | Contact |
| QE-B1 Calibrated Silicon Reference Cell, 20 × 20 mm, NIST-Traceable |
QE-B1
| — | — | — | Contact |
| SCS600 Series Solar Cell Quantum Efficiency System, EQE/IQE, 300–2500 nm |
SCS600 Series
| — | — | — | Contact |
| SCS600-MAX Large-Area Solar Cell QE System, 250 × 250 mm, QE and LBIC Mapping Current |
SCS600-MAX
| — | — | — | |
| SolarIV Series Solar Cell I-V Test System, Class A AM1.5G Simulator |
SolarIV Series
| — | — | — | Contact |
| Sirius Series Solar Simulators, Class A AM1.5G, 0.2–1.2 Sun Adjustable |
Sirius Series
| — | — | — | Contact |