

SCS600 Series Solar Cell Quantum Efficiency System, EQE/IQE, 300–2500 nm
SCS600 SeriesDesign Tools
Measures EQE, IQE, spectral response and IPCE of solar cells made from a wide range of materials.
The SCS600 series measures the quantum efficiency and spectral response of solar cells of various materials using the substitution method against a calibrated standard detector, for university and institute labs as well as industrial R&D and production QC. It works with Keithley 2612B and 2636B source meters for accurate data acquisition and bias testing, and a large sample chamber with double doors simplifies sample loading. Xenon, tungsten and dual-source versions cover 300–1100 nm (1700 nm optional) up to 300–2500 nm.
Key Features
- EQE, IQE, spectral response and IPCE measurement with integrated Jsc calculation
- Xenon and tungsten light sources with stability better than 99% for repeatable substitution-method results
- All-reflective optical path avoids chromatic aberration, so the spot size stays the same at every wavelength
- 150 W xenon lamp delivering more than 6 mW/cm² at 500 nm
- Bias light and bias voltage tests, light beam induced current (LBIC) measurement, AC and DC data acquisition
- Monitoring CCD camera for spot observation and precise sample positioning
- Measures samples inside glove boxes and vacuum chambers; IPCE-PVK glove-box accessory available
Typical Applications
- Quantum efficiency of solar cells of various materials
- Multi-cell samples measured with LED bias light
- Dye-sensitized solar cells
- Air-sensitive samples in glove boxes
- University and institute photovoltaic research
- Industrial R&D and production quality control
Model Overview
| Model | Light Source | Wavelength Range | Repeatability 200–400 nm | Repeatability 400–1000 nm | Repeatability 1000–1700 nm |
|---|---|---|---|---|---|
| SCS600-XE | Xenon | 300–1100 nm (1700 nm optional) | ≤2% | ≤1% | ≤1.5% |
| SCS600-TH | Tungsten | 400–2500 nm | – | ≤1% | ≤1.5% |
| SCS600-XT | Dual (xenon + tungsten) | 300–2500 nm | ≤2% | ≤1% | ≤1.5% (1000–2500 nm) |
Related Products
- SolarIV Series — Solar Cell I-V Test System
- Sirius Series — Solar Simulators
- SCS600-MAX — Large-Area Solar Cell QE System
Browse all: Photoelectric Test Systems · Spectroscopic Instruments
Models: SCS600-XE, SCS600-TH, SCS600-XT · Contact WaveQuanta for a quote, configuration advice and lead time.
| Measurement Functions | EQE, IQE, spectral response, IPCE, integrated Jsc, LBIC |
| Measurement Method | Substitution method against standard detector |
| Light Source | Xenon (XE), tungsten (TH) or dual source (XT) |
| Wavelength Range | 300–1100 nm (XE, 1700 nm optional); 400–2500 nm (TH); 300–2500 nm (XT) |
| Wavelength Accuracy | ±0.2 nm |
| Wavelength Repeatability | ±0.1 nm |
| Minimum Scanning Step | 0.005 nm |
| Diffraction Gratings | Three gratings: 1200, 600 and 300 lines/mm |
| Wavelength Resolution | FWHM 0.1 nm (300 mm focal length, 1200 g/mm grating, 0.01 mm slit) |
| Filter Wheel | Motorized, software controlled |
| Light Source Stability | > 99% |
| Xenon Lamp | 150 W, > 6 mW/cm² at 500 nm |
| Light Spot Size | 1 × 1 mm² to 10 × 10 mm² |
| Sample Dimensions | 50 × 50 mm² to 100 × 100 mm² |
| Data Acquisition | AC and DC modes; compatible with Keithley 2612B and 2636B source meters |
| Bias Tests | Bias light and bias voltage |
| Monitoring | CCD camera |
| Bias LEDs, 365–550 nm | M365L 420 mW, M405L 400 mW, M450L 320 mW, M550L 50 mW |
| Bias LEDs, 610–980 nm | M610L 80 mW, M690L 100 mW, M760L 100 mW, M880L 50 mW, M980L 50 mW |
| Glove Box Accessory IPCE-PVK | Fits standard glove box, external light source, 3D sample adjustment, dual door, CCD |
| Probe Stage IV-F1 | Vacuum adsorption, large cells, I-V, max. sample 100 × 100 mm |
| Probe Stage IV-F2 | Vacuum adsorption, small cells, I-V, max. sample 50 × 50 mm |
| Probe Stage QE-F4 | Two 3D probes, oxygen-free copper base electrode, QE, max. 30 × 30 mm |
| Probe Stage QE-F6-C | 3M test clip, 2D adjustable, I-V/QE, max. 100 × 100 mm, dye-sensitized cells |
| Probe Stage QE-F6-D | Back-electrode stage, rotary selector for multi-cell samples, I-V/QE, max. 35 × 35 mm |
| Probe Stage QE-F6-H | Gas-sealed back-electrode stage, rotary selector, gas circulation, max. 35 × 35 mm |
Product Family: Photoelectric Test Systems (9 variants)
| Product | SKU | Size | Clear Aperture | Operating Wavelength | |
|---|---|---|---|---|---|
| DSR900 Camera Characteristics Measurement System, EMVA 1288, 200–2500 nm |
DSR900
| — | — | — | Contact |
| DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot |
DSR500-LBIC
| — | — | — | Contact |
| DSR600 Photodetector Spectral Response System, 200–2400 nm, Lock-in Detection |
DSR600 Series
| — | — | — | Contact |
| DSR300 Micro-Nano Device Spectral Response System, 40 µm Spot, LBIC Mapping |
DSR300 Series
| — | — | — | Contact |
| QE-B1 Calibrated Silicon Reference Cell, 20 × 20 mm, NIST-Traceable |
QE-B1
| — | — | — | Contact |
| SCS600 Series Solar Cell Quantum Efficiency System, EQE/IQE, 300–2500 nm Current |
SCS600 Series
| — | — | — | |
| SCS600-MAX Large-Area Solar Cell QE System, 250 × 250 mm, QE and LBIC Mapping |
SCS600-MAX
| — | — | — | Contact |
| SolarIV Series Solar Cell I-V Test System, Class A AM1.5G Simulator |
SolarIV Series
| — | — | — | Contact |
| Sirius Series Solar Simulators, Class A AM1.5G, 0.2–1.2 Sun Adjustable |
Sirius Series
| — | — | — | Contact |






