DSR500-LBIC micro-nano photocurrent (lbic) imaging system
WaveQuanta

DSR500-LBIC Micro-Nano Photoelectric Imaging System, Galvo Scanning, 2 µm Spot

DSR500-LBIC
Contact for pricing
In Stock
Contact Sales

Design Tools

Photonics Calculators Explore 49 free online calculators for photonics design Unit Converters Convert between wavelength, frequency, power, and more
View all 49 calculators →
RoHS REACH

Galvo-scanned laser photocurrent imaging for mapping short-circuit current, defects and reflectance in micro-nano devices.

The DSR500-LBIC combines microscopic imaging with galvanometer laser scanning to deliver a small, stable monochromatic spot onto photovoltaic and photoelectric test devices. As the spot is scanned in XY, the software records the current at each point and builds a map of short-circuit current distribution, surface defects and reflectance, with the spot profile kept constant across the scan field. Typical samples include dye-sensitized, mono- and multicrystalline silicon, organic semiconductor and GaN devices.

Key Features

  • Galvo scanning for fast, high-resolution mapping without stage vibration effects
  • Standard 532 nm laser; a second laser (405 or 635 nm, 10 or 30 mW) optional
  • 20× objective with 260 × 200 µm maximum scan field, 2 µm laser spot and 0.2 µm minimum step
  • Keithley 2450 source meter: 1 nA–1 A current range, 20 fA resolution, 0.03% accuracy
  • 65 mm vacuum chuck carries both sample and probe holders, so moving the sample keeps electrode contact
  • Photocurrent mapping at fixed bias and point-by-point I-V curve scanning over a user-selected area
  • Optional spectral responsivity, QE and bias voltage tests from 200 to 1100 nm, extendable to 2500 nm

Typical Applications

  • Nanomaterials and 2D materials
  • Wafer analysis
  • Photoelectric characterization of detectors
  • Pixel measurement of area-array detectors
  • Micro-domain charge generation in devices
  • Solar cell current uniformity and defect analysis

Model Overview

Model Laser Objective Probe Station Data Acquisition Unit
DSR500-LBIC 532 nm, 30 mW 20×, WD 7.5 mm 2 probe holders Keithley 2450
DSR500-LBIC-RDB 532 nm, 30 mW 20×, WD 7.5 mm 2 probe holders Not included

Related Products

Browse all: Photoelectric Test Systems · Spectroscopic Instruments

Models: DSR500-LBIC, DSR500-LBIC-RDB · Contact WaveQuanta for a quote, configuration advice and lead time.

Standard Laser 532 nm, 30 mW, stability 1% @ 2 h
Optional Laser 405 nm or 635 nm, 10 mW or 30 mW, output stability < 1% @ 2 h
Number of Lasers 1 standard, 2 optional
Illumination Reflective / transmissive LED lighting
Objective 20× (Olympus), WD 7.5 mm, 350–750 nm
Max. Scanning Range 260 × 200 µm (20× objective)
Laser Spot 2 µm
Spatial Accuracy < 1 µm
Scan Step 0.2–30 µm (minimum 0.2 µm)
Source Meter Keithley 2450 (DSR500-LBIC)
Current Range 1 nA–1 A
Noise / Resolution 50 pA / 20 fA
Measurement Accuracy 0.03%
Sample Chuck Φ65 mm vacuum suction plate; sample and probe holders move together
Stage Travel 25 mm, 5 µm resolution
Probe Holders 2, XYZ travel 12 mm, 0.7 µm resolution
Probes Tungsten, 5, 10 or 20 µm diameter
Scan Modes Photocurrent mapping at fixed voltage; I-V curve scanning per point
Data Processing Thresholding, zoom, contour lines, line profile, 3D display, TXT/Excel export
Optional Spectral Responsivity 200–1100 nm, extendable to 2500 nm; SR, QE and bias voltage tests
Specification Sheet PDF — Download
No CAD drawings available for this product.
DInSb Series ln2-cooled insb infrared detector
WaveQuanta

DInSb Series Liquid-Nitrogen-Cooled InSb Detectors, 1–5.5 µm

DInSb Series
Contact for pricing
Contact Sales
DCS540 optical chopper
WaveQuanta

DCS540 Optical Chopper System, 20 Hz–5 kHz, 0.01 Hz Resolution

DCS540
Contact for pricing
Contact Sales